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Description
2016 4PIN Crystal Probe Burn-in Socket 2.0*1.6 Flip Cover Test Fixture2016 crystal probe oscillator burn in socket 4pin 2. 0*1. 6mm flip cover test fixture. Introduction: Product use: burn in socket, test socket, high and low temperature burn in test of IC chips in 2016 (2. 0*1. 6mm). Packages: 2016 (2. 0*1. 6mm) 4PIN crystal probe oscillator burn in test socket. Features: 1. Probe structure, using double contact technology, stable connection, small size. 2. Special engineering plastics are used, high strength, long
2016 crystal probe oscillator burn-in socket 4pin 2.0*1.6mm flip cover test fixture.
Introduction:
Product use: burn-in socket, test socket, high and low temperature burn in test of IC chips in 2016 (2.0*1.6mm).
Packages: 2016 (2.0*1.6mm) -4PIN crystal probe oscillator burn-in test socket.
Features:
1. Probe structure, using double contact technology, stable connection, small size.
2. Special engineering plastics are used, high strength, long life, small impedance, good elasticity.
3. Gold-plated layer thickening, contact thickening electroplating, ultra-low contact impedance, high reliability, service life (flip structure 20,000 times)
Parameters:
Model: 2016 (2.0*1.6mm) -4PIN
Pins: 4
Chip size: 2.0*1.6mm
Shipping Notes
- Free Standard Shipping on $100+ Orders to the USA.
- Except Preorder products are shipped in 48 hours.
- Delivery to the USA:
- Standard Shipping : 3-10 business days
- If time is of the essence, please consider selecting expedited delivery for faster service.
Exchange/Return Notes
- We offer a 30-day return/exchange service after receiving.
- Final sale items are not eligible for returns or exchanges.
- To process your return/exchange, please contact us at [email protected]
- Please click here for more details>>> Return & Exchange Policy